One challenge for automated patch clamp has been to incorporate amplifiers which automatically detect and handle changes in membrane capacitance, series resistance (Rs) and voltage-clamp time constants during an experiment. If these adjustments are not made correctly there is risk of generating imprecise data or even losing data due to artefacts in the recorded trace (Sakmann, Bert and Neher, Erwin, Single channel recording, 2nd ed. New York, 1995).

  • Series resistance compensation for fast activating ion channels
  • Remove patch clamp artifacts
  • Precise membrane patch clamp accuracy
  • Increase data throughput while maintaining high quality recordings with automatic clip detection
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